Modeling substrate noise generation in CMOS digital integrated circuits

Abstract

A time-series divided parasitic capacitance model accurately simulates substrate noise generation of practical CMOS digital integrated circuits in the time domain. The simulation of a 0.25-/spl mu/m z80 microcontroller with 62.5-MHz clock frequency costs less than 10 sec per a clock cycle including the model generation. Simulated substrate noise compares well with 200-ps 100-/spl mu/V resolution measurements in wave-shapes validated for clock frequency up to 125 MHz and shows a peak-amplitude error of less than 2% against supply-voltage scaling from 2.5 V to 1.6 V.