Switching response of graded-base PN junction diodes

Abstract

This paper extends the earlier analysis by Kingston of the switching response of a uniform-base diode to a graded-base diode. It concerns the time required to switch a diode from a forward-biased to a reverse-biased condition. The current transient can be separated into two phases: 1) the constant current phase during which the carrier density at the junction changes gradually from a forward-biased to a reverse-biased condition, and 2) the nonconstant current phase during which the injected carriers stored in the base region gradually disappear. In the present analysis, it is found that in a graded-base diode where the impurity concentration decreases from the emitter junction towards the base contact, the time for the constant current phase is greatly shortened because of favorable initial carrier distribution. The effect is already significant if the impurity concentration changes by a factor from 3 to 1 from the emitter junction to the base contact. To shorten the nonconstant current phase, however, a much larger change of impurity concentration, say of the order from 500 to 1, from the emitter junction to the base contact is needed.