A simple 1-transistor capacitor-less memory cell for high performance embedded DRAMs

P. Fazan, S. Okhonin, M. Nagoga, J. Sallese
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引用次数: 23

Abstract

A new compact memory architecture is proposed for embedded dynamic random access memory (eDRAM) cells. By exploiting the floating body effect of partially depleted silicon on insulator (SOI) devices, a one-transistor memory cell can be integrated in a pure logic SOI technology without adding any process step. The data retention, device operation principles and reliability make it ideal for high performance eDRAM applications while reducing the cell area by a factor of two.
用于高性能嵌入式dram的简单1晶体管无电容存储单元
针对嵌入式动态随机存取存储器(eDRAM)单元,提出了一种新的紧凑存储结构。利用部分贫硅绝缘体(SOI)器件的浮体效应,可以将单晶体管存储单元集成到纯逻辑SOI技术中,而无需增加任何工艺步骤。数据保留,设备操作原理和可靠性使其成为高性能eDRAM应用的理想选择,同时将单元面积减少了两倍。
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