MATS**: An On-Line Testing Approach for Reconfigurable Embedded Memories

Ludovica Bozzoli, L. Sterpone
{"title":"MATS**: An On-Line Testing Approach for Reconfigurable Embedded Memories","authors":"Ludovica Bozzoli, L. Sterpone","doi":"10.1109/DFT.2018.8602934","DOIUrl":null,"url":null,"abstract":"Modern Field Programmable Gate Arrays (FPGAs) embed dedicated blocks for Memories (BRAMs), digital signal processing (DSPs) and hardwired microprocessors merged with the reconfigurable logic array. This trend, coupled with Error Correction Code (ECC) mechanism and Dynamic Partial Reconfiguration (DPR), makes these devices ideal candidates for mission critical applications where high reliability is a strict requirement. Therefore, efficient and in-field testing became a major concern. Unfortunately, typical on-line memory testing approaches are not fully optimized for the reconfigurable scenario. In fact, a suitable fault model should be considered in order to enhance the fault coverage and reduce the test redundancy. In this work, we proposed the MATS** algorithm, which is able to reduce the execution time and optimize the fault coverage with respect to most popular embedded memories March Tests. Furthermore, MATS** results to be highly suitable to be executed, even partially, in brief time slots available within the device mission. Experimental results show that our approach is around 30% faster than state-of-the-art solutions while achieving the optimal fault coverage.","PeriodicalId":297244,"journal":{"name":"2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","volume":"502 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DFT.2018.8602934","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3

Abstract

Modern Field Programmable Gate Arrays (FPGAs) embed dedicated blocks for Memories (BRAMs), digital signal processing (DSPs) and hardwired microprocessors merged with the reconfigurable logic array. This trend, coupled with Error Correction Code (ECC) mechanism and Dynamic Partial Reconfiguration (DPR), makes these devices ideal candidates for mission critical applications where high reliability is a strict requirement. Therefore, efficient and in-field testing became a major concern. Unfortunately, typical on-line memory testing approaches are not fully optimized for the reconfigurable scenario. In fact, a suitable fault model should be considered in order to enhance the fault coverage and reduce the test redundancy. In this work, we proposed the MATS** algorithm, which is able to reduce the execution time and optimize the fault coverage with respect to most popular embedded memories March Tests. Furthermore, MATS** results to be highly suitable to be executed, even partially, in brief time slots available within the device mission. Experimental results show that our approach is around 30% faster than state-of-the-art solutions while achieving the optimal fault coverage.
MATS**:可重构嵌入式存储器的在线测试方法
现代现场可编程门阵列(fpga)嵌入存储器(bram)专用块,数字信号处理(dsp)和硬连线微处理器与可重构逻辑阵列合并。这种趋势,加上纠错码(ECC)机制和动态部分重构(DPR),使这些设备成为对高可靠性有严格要求的关键任务应用的理想候选者。因此,高效和现场测试成为一个主要问题。不幸的是,典型的在线内存测试方法并没有完全针对可重构场景进行优化。实际上,为了提高故障覆盖率和减少测试冗余,需要考虑合适的故障模型。在这项工作中,我们提出了MATS**算法,该算法能够减少执行时间并优化目前最流行的嵌入式存储器三月测试的故障覆盖率。此外,MATS**结果非常适合在设备任务中可用的短时间内执行,甚至部分执行。实验结果表明,在实现最佳故障覆盖率的同时,我们的方法比最先进的解决方案快30%左右。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信