{"title":"Development of EMC analysis technology using large-scale electromagnetic field analysis","authors":"Ryo Matsubara, K. Inokuchi","doi":"10.23919/EOS/ESD.2019.8870011","DOIUrl":null,"url":null,"abstract":"Recently, digital devices require LSI operated with higher frequency and lower voltage, therefore Countermeasures for EMC (Electromagnetic Compatibility) problem are becoming more difficult. Analytical EMC solving techniques, which contribute to design more directly and efficiently than the conventional approach, has been developed for Electro Magnetic Radiation and Electro-Static Discharge.","PeriodicalId":233379,"journal":{"name":"2019 41st Annual EOS/ESD Symposium (EOS/ESD)","volume":"216 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 41st Annual EOS/ESD Symposium (EOS/ESD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/EOS/ESD.2019.8870011","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
Recently, digital devices require LSI operated with higher frequency and lower voltage, therefore Countermeasures for EMC (Electromagnetic Compatibility) problem are becoming more difficult. Analytical EMC solving techniques, which contribute to design more directly and efficiently than the conventional approach, has been developed for Electro Magnetic Radiation and Electro-Static Discharge.