Polarimetry For Nickel-Chromium Two-Layer Nanofilms And Nickel Nanostripe On A Glass Substrate

Abstract

In this work the reflection properties of the collection of nickel nanostripes, deposited on the glass substrate and the chromium nanofilm, are described in terms of polarimetry. The experimentally determined ellipsometric parameters allow to describe the complex refraction index of the given Ni-Cr and Ni-glass substrate thin films. The complex refractive index depends on the high frequency conductivity of the multilayer systems, such as ferromagnetic-antiferromagnetic-glass, ferromagnetic-glass. If the nanostripe of nickel, 250 nm in thickness, is deposited at about 250 °C onto the chromium nanofilm (250 nm in thickness), it is experimentally observed that the state (intrinsic structure) of the nickel nano-stripes differs for the nanosystems, such as nickel nanostripe-chromium nanofilm and nickel nanostripe-glass substrate. The topological systems of multiple nanostripes are proposed for an analytical signal processing as the representation of a number (or a magnitude of a signal level) by the power series of the corresponding Mueller matrix.