Electrical and optical properties of tin oxide-gallium arsenide heterojunctions

B. J. Baliga, S. Ghandhi, J. Borrego
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引用次数: 3

Abstract

This paper describes the electrical and optical properties of tin oxide-gallium arsenide heterojunctions. These structures, comprising a highly conducting, wide gap semiconductor in contact with a lightly doped, narrower gap semiconductor substrate, have promise for photovoltaic applications. Epitaxial layers of gallium arsenide were grown by the reaction of trimethylgallium and arsine. These were covered with tin oxide, which was formed by the oxidation of tetramethyltin. All processing is described for eliminating photo-suppression effects in these structures. The photo-response and the electrical characteristics of the cells are also described.
氧化锡-砷化镓异质结的电学和光学性质
本文介绍了氧化锡-砷化镓异质结的电学和光学性质。这些结构,包括高导电性,宽间隙半导体与轻掺杂,窄间隙半导体衬底接触,有希望用于光伏应用。利用三甲基镓与砷酸盐的反应,制备了砷化镓外延层。它们被氧化锡覆盖,氧化锡是由四甲基锡氧化形成的。描述了消除这些结构中的光抑制效应的所有处理。还描述了电池的光响应和电特性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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