{"title":"Automated fixing of complex/process critical DRC violations in place and route systems using calibre in the synopsys/milkyway environment","authors":"V. Lakshmanan","doi":"10.1109/IWSOC.2004.10006","DOIUrl":null,"url":null,"abstract":"With the proliferation of analog/mixed signal SoCs, physical verification has become the critical link not only at the cell/block and full-chip levels, but also between design styles. It is equally critical for successful data transfer between and within semiconductor companies, and providers of library components, external IP, internal IP and design services. Adopting a single, robust, hierarchical-based physical verification tool not only streamlines the design flow, it saves the time and cost of supporting multiple tools, eliminates the discrepancies created by the differences between tools, and ensures successful data transfer. This tutorial will demonstrate how a single physical verification tool can be easily integrated throughout the design flow, across design styles and within popular design frameworks.","PeriodicalId":306688,"journal":{"name":"4th IEEE International Workshop on System-on-Chip for Real-Time Applications","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-07-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"4th IEEE International Workshop on System-on-Chip for Real-Time Applications","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IWSOC.2004.10006","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
With the proliferation of analog/mixed signal SoCs, physical verification has become the critical link not only at the cell/block and full-chip levels, but also between design styles. It is equally critical for successful data transfer between and within semiconductor companies, and providers of library components, external IP, internal IP and design services. Adopting a single, robust, hierarchical-based physical verification tool not only streamlines the design flow, it saves the time and cost of supporting multiple tools, eliminates the discrepancies created by the differences between tools, and ensures successful data transfer. This tutorial will demonstrate how a single physical verification tool can be easily integrated throughout the design flow, across design styles and within popular design frameworks.