Flux activity evaluation using the wetting balance

C. Huang, K. Srihari, A. McLenaghan, G. Westby
{"title":"Flux activity evaluation using the wetting balance","authors":"C. Huang, K. Srihari, A. McLenaghan, G. Westby","doi":"10.1109/IEMT.1995.526185","DOIUrl":null,"url":null,"abstract":"The selection of soldering flux plays a critical role in determining the manufacturing yield and product reliability of printed circuit board assemblies. Fluxes are used to remove oxides and other contaminants on the component leads and the pads on the printed circuit board. They also assist in the transfer of heat. The selection of flux should depend on properties such as its ability to remove the (oxides) tarnish film, activation temperature, corrosiveness, and the resistivity of post process residues. The activity level of a flux influences its ability to clean the oxides on the specimen's surface and to promote wetting. It (the flux activity level) may be altered by changing the contents of the activators that make-up the flux chemistry. This research provides an approach to evaluate the influence of the flux activity in promoting wetting through the use of wetting balance analysis. Standardized specimens were used along with a set of specified test variables. The experimental procedure was determined based on the information obtained through initial experiments. The results obtained can serve as a bench mark for evaluating candidate fluxes for future use in the manufacturing process.","PeriodicalId":123707,"journal":{"name":"Seventeenth IEEE/CPMT International Electronics Manufacturing Technology Symposium. 'Manufacturing Technologies - Present and Future'","volume":"51 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1995-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"12","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Seventeenth IEEE/CPMT International Electronics Manufacturing Technology Symposium. 'Manufacturing Technologies - Present and Future'","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEMT.1995.526185","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 12

Abstract

The selection of soldering flux plays a critical role in determining the manufacturing yield and product reliability of printed circuit board assemblies. Fluxes are used to remove oxides and other contaminants on the component leads and the pads on the printed circuit board. They also assist in the transfer of heat. The selection of flux should depend on properties such as its ability to remove the (oxides) tarnish film, activation temperature, corrosiveness, and the resistivity of post process residues. The activity level of a flux influences its ability to clean the oxides on the specimen's surface and to promote wetting. It (the flux activity level) may be altered by changing the contents of the activators that make-up the flux chemistry. This research provides an approach to evaluate the influence of the flux activity in promoting wetting through the use of wetting balance analysis. Standardized specimens were used along with a set of specified test variables. The experimental procedure was determined based on the information obtained through initial experiments. The results obtained can serve as a bench mark for evaluating candidate fluxes for future use in the manufacturing process.
利用润湿平衡评价通量活度
焊剂的选择对印刷电路板组件的制造成品率和产品可靠性起着至关重要的作用。助焊剂用于去除元件引线和印刷电路板上的焊盘上的氧化物和其他污染物。它们还有助于热量的传递。焊剂的选择应取决于其性能,如去除(氧化物)变色膜的能力、活化温度、腐蚀性和加工后残留物的电阻率。焊剂的活性水平影响其清除试样表面氧化物和促进润湿的能力。它(熔剂活性水平)可以通过改变构成熔剂化学的活化剂的含量而改变。本研究提供了一种利用润湿平衡分析来评估通量活度对促进润湿的影响的方法。标准化标本与一组指定的测试变量一起使用。根据初步实验所得的信息确定实验步骤。所得结果可作为评价候选助焊剂的基准,以供将来在制造过程中使用。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信