J. Balasch, F. Bernard, V. Fischer, Miloš Grujić, Marek Laban, O. Petura, Vladimir Rožić, Gerard van Battum, I. Verbauwhede, M. Wakker, Bohan Yang
{"title":"Design and testing methodologies for true random number generators towards industry certification","authors":"J. Balasch, F. Bernard, V. Fischer, Miloš Grujić, Marek Laban, O. Petura, Vladimir Rožić, Gerard van Battum, I. Verbauwhede, M. Wakker, Bohan Yang","doi":"10.1109/ETS.2018.8400697","DOIUrl":null,"url":null,"abstract":"The objective of this paper is to provide insight on the design, evaluation and testing of modern True Random Number Generators (TRNGs) aimed towards certification. We discuss aspects related to each of these stages by means of two illustrative TRNG designs: PLL-TRNG and DC-TRNG. Topics covered in the paper include: the importance of formal security evaluations based on a stochastic model of the entropy source, the development of suitable and lightweight embedded tests to detect failures, the implementation and testing of TRNGs in dedicated FPGA platforms, and a robustness assessment to environmental and/or physical modifications.","PeriodicalId":223459,"journal":{"name":"2018 IEEE 23rd European Test Symposium (ETS)","volume":"4 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"20","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE 23rd European Test Symposium (ETS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ETS.2018.8400697","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 20
Abstract
The objective of this paper is to provide insight on the design, evaluation and testing of modern True Random Number Generators (TRNGs) aimed towards certification. We discuss aspects related to each of these stages by means of two illustrative TRNG designs: PLL-TRNG and DC-TRNG. Topics covered in the paper include: the importance of formal security evaluations based on a stochastic model of the entropy source, the development of suitable and lightweight embedded tests to detect failures, the implementation and testing of TRNGs in dedicated FPGA platforms, and a robustness assessment to environmental and/or physical modifications.