A 5.3GHz 8T-SRAM with Operation Down to 0.41V in 65nm CMOS

Leland Chang, Yutaka Nakamura, R. Montoye, J. Sawada, Andrew K. Martin, Kiyofumi Kinoshita, Fadi H. Gebara, Kanak B. Agarwal, D. Acharyya, Wilfried Haensch, Kohji Hosokawa, D. Jamsek
{"title":"A 5.3GHz 8T-SRAM with Operation Down to 0.41V in 65nm CMOS","authors":"Leland Chang, Yutaka Nakamura, R. Montoye, J. Sawada, Andrew K. Martin, Kiyofumi Kinoshita, Fadi H. Gebara, Kanak B. Agarwal, D. Acharyya, Wilfried Haensch, Kohji Hosokawa, D. Jamsek","doi":"10.1109/VLSIC.2007.4342739","DOIUrl":null,"url":null,"abstract":"A 32 kb subarray demonstrates practical implementation of a 65 nm node 8T-SRAM cell for variability tolerance in highspeed caches. Ideal cell stability allows single-supply operation down to 0.41 V at 295 MHz without dynamic voltage techniques. Despite a larger cell, array area is competitive with 6T-SRAM due to higher array efficiency. With an LSDL decoder, a gated diode sense amplifier, and design tradeoffs enabled by the 8 T cell, 5.3 GHz operation at 1.2 V is achieved.","PeriodicalId":261092,"journal":{"name":"2007 IEEE Symposium on VLSI Circuits","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-06-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"121","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 IEEE Symposium on VLSI Circuits","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VLSIC.2007.4342739","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 121

Abstract

A 32 kb subarray demonstrates practical implementation of a 65 nm node 8T-SRAM cell for variability tolerance in highspeed caches. Ideal cell stability allows single-supply operation down to 0.41 V at 295 MHz without dynamic voltage techniques. Despite a larger cell, array area is competitive with 6T-SRAM due to higher array efficiency. With an LSDL decoder, a gated diode sense amplifier, and design tradeoffs enabled by the 8 T cell, 5.3 GHz operation at 1.2 V is achieved.
在65nm CMOS中工作电压低至0.41V的5.3GHz 8T-SRAM
一个32 kb的子阵列演示了65 nm节点8T-SRAM单元在高速缓存中的变异性容忍度的实际实现。理想的电池稳定性允许在295 MHz下的单电源操作低至0.41 V,无需动态电压技术。尽管单元更大,但由于阵列效率更高,阵列面积与6T-SRAM具有竞争力。通过LSDL解码器、门控二极管感测放大器和8t单元实现的设计权衡,可以实现1.2 V下的5.3 GHz工作。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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