Low power 1T DRAM/NVM versatile memory featuring steep sub-60-mV/decade operation, fast 20-ns speed, and robust 85°C-extrapolated 1016 endurance

Y. Chiu, Chun‐Hu Cheng, Chun-Yen Chang, Min-Hung Lee, H. Hsu, S. Yen
{"title":"Low power 1T DRAM/NVM versatile memory featuring steep sub-60-mV/decade operation, fast 20-ns speed, and robust 85°C-extrapolated 1016 endurance","authors":"Y. Chiu, Chun‐Hu Cheng, Chun-Yen Chang, Min-Hung Lee, H. Hsu, S. Yen","doi":"10.1109/VLSIT.2015.7223671","DOIUrl":null,"url":null,"abstract":"In this work, we report a one-transistor (1T) versatile memory; the memory transistor characteristics achieve sub-60-mV/dec operation and considerably low off-state leakage of 10<sup>-15</sup> A/μm at a supply voltage below 0.5V. The versatile memory features DRAM/NVM functions of large ΔV<sub>T</sub> window of 2.8V, fast 20-ns speed, 10<sup>3</sup>s retention at 85°C, and long extrapolated 10<sup>16</sup> endurance at 85°C, which show the potential for 3D memory application with severe requirement on both high density and low power consumption.","PeriodicalId":181654,"journal":{"name":"2015 Symposium on VLSI Technology (VLSI Technology)","volume":"90 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"35","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 Symposium on VLSI Technology (VLSI Technology)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VLSIT.2015.7223671","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 35

Abstract

In this work, we report a one-transistor (1T) versatile memory; the memory transistor characteristics achieve sub-60-mV/dec operation and considerably low off-state leakage of 10-15 A/μm at a supply voltage below 0.5V. The versatile memory features DRAM/NVM functions of large ΔVT window of 2.8V, fast 20-ns speed, 103s retention at 85°C, and long extrapolated 1016 endurance at 85°C, which show the potential for 3D memory application with severe requirement on both high density and low power consumption.
低功耗1T DRAM/NVM多功能存储器,具有陡峭的60 mv / 10年以下操作,快速20 ns速度,以及85°c外推1016耐用性
在这项工作中,我们报告了一种单晶体管(1T)通用存储器;在电源电压低于0.5V时,存储器晶体管的特性实现了低于60 mv /dec的工作和相当低的10-15 A/μm的关断漏。该多功能存储器具有2.8V的ΔVT大窗口、20 ns的快速速度、85°C下103s的保留时间和85°C下1016的长外推续航时间等DRAM/NVM功能,显示出对高密度和低功耗有严格要求的3D存储器应用的潜力。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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