M. Marchetti, G. Avolio, M. Squillante, Ajay K. Doggalli
{"title":"Load pull measurement techniques: architecture, accuracy, and applications","authors":"M. Marchetti, G. Avolio, M. Squillante, Ajay K. Doggalli","doi":"10.1109/BCICTS45179.2019.8972744","DOIUrl":null,"url":null,"abstract":"This paper focuses on challenges and requirements posed by future communication systems on load-pull measurements. In particular, we discuss the architecture of a state-of-the-art mixed-signal load pull measurement system which enables wideband impedance control with complex modulated signals. We also address some aspects related to dynamic-range improvement and describe a procedure for evaluating traceable uncertainty of power measurements as a function of the load impedance. We also present a few application examples showing how load-pull can support testing and development of devices and circuits of next-generation systems.","PeriodicalId":243314,"journal":{"name":"2019 IEEE BiCMOS and Compound semiconductor Integrated Circuits and Technology Symposium (BCICTS)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 IEEE BiCMOS and Compound semiconductor Integrated Circuits and Technology Symposium (BCICTS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/BCICTS45179.2019.8972744","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
Abstract
This paper focuses on challenges and requirements posed by future communication systems on load-pull measurements. In particular, we discuss the architecture of a state-of-the-art mixed-signal load pull measurement system which enables wideband impedance control with complex modulated signals. We also address some aspects related to dynamic-range improvement and describe a procedure for evaluating traceable uncertainty of power measurements as a function of the load impedance. We also present a few application examples showing how load-pull can support testing and development of devices and circuits of next-generation systems.