Plasma-resonant THz detection with HEMTs

J. Mateos, H. Marinchio, C. Palermo, L. Varani, T. González
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引用次数: 2

Abstract

In this work, by means of Monte Carlo simulations we analyze the dependence of the DC drain current value in a 80nm-gate InAlAs/InGaAs HEMTs on the frequency of a sinusoidal signal superimposed to the DC gate bias. Interestingly, a resonant peak appears in the drain current response, which lies in the THz frequency range, in good agreement with recent experiments made on similar devices. Moreover, the frequency of the resonant peak is dependent on the length of the source-gate region, but independent of the length of the drain-gate region, thus indicating that the source-gate region acts as the plasma wave cavity leading to the resonant detection of THz radiation in HEMTs.
等离子共振太赫兹探测与hemt
在这项工作中,通过蒙特卡罗模拟,我们分析了80nm栅极InAlAs/InGaAs hemt中直流漏极电流值与叠加到直流栅极偏置的正弦信号频率的关系。有趣的是,漏极电流响应中出现了一个谐振峰,它位于太赫兹频率范围内,与最近在类似设备上进行的实验很好地一致。此外,谐振峰的频率依赖于源极区域的长度,而与漏极区域的长度无关,这表明源极区域充当等离子体波腔,导致hemt中太赫兹辐射的共振检测。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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