Theoretical and experimental study of thermal resistance & temperature distribution in high-power AlGaInN LED arrays

A. Chernyakov, A. Aladov, A. L. Zakgeim, M. N. Mizerov, V. Ustinov, I. A. Kalashnikov, A. Gavrikov, V. Smirnov, V. Sergeev
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Abstract

The driving current, chip area of high-power AlGaInN light emitting diodes (LEDs) and the level of integration of LED arrays are continuously increased to provide ever higher output light flux. The new developments require more attention to pay to the thermal management of LEDs, commonly assessed in terms of the thermal resistance. Temperature distribution in a LED array and its effect on the chip thermal resistance has been studied both theoretically and experimentally. The thermal measurements were performed with the help of a temperature-sensitive parameter - forward voltage drop on the p-n junction under the action of heating current. Two methods of heat exciting were used: step-like or harmonically pulse-width modulated heating current. Analysis of forward voltage relaxation at transient thermal processes allows determination of thermal impedance components corresponding to the structural elements of the LEDs and arrays. The temperature distribution in the LED array predicted by coupled simulations of the heat transfer agrees well with the experimental measured temperature mapping by the IR-microscopy.
大功率AlGaInN LED阵列热阻及温度分布的理论与实验研究
高功率AlGaInN发光二极管(LED)的驱动电流、芯片面积和LED阵列的集成度不断提高,以提供更高的输出光通量。新的发展需要更多地关注led的热管理,通常以热阻来评估。本文从理论和实验两方面研究了LED阵列的温度分布及其对芯片热阻的影响。热测量是借助温度敏感参数-在加热电流作用下的p-n结上的正向压降进行的。热激励采用两种方法:步进式和谐波脉宽调制加热电流。分析瞬态热过程中的正向电压松弛,可以确定与led和阵列结构元件相对应的热阻抗组件。传热耦合模拟预测的LED阵列内温度分布与红外显微实验测得的温度图吻合较好。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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