Hidetomo Kobayashi, K. Kato, Takuro Ohmaru, S. Yoneda, T. Nishijima, Shuhei Maeda, K. Ohshima, H. Tamura, Hiroyuki Tomatsu, T. Atsumi, Y. Shionoiri, Y. Maehashi, J. Koyama, S. Yamazaki
{"title":"Processor with 4.9-μs break-even time in power gating using crystalline In-Ga-Zn-oxide transistor","authors":"Hidetomo Kobayashi, K. Kato, Takuro Ohmaru, S. Yoneda, T. Nishijima, Shuhei Maeda, K. Ohshima, H. Tamura, Hiroyuki Tomatsu, T. Atsumi, Y. Shionoiri, Y. Maehashi, J. Koyama, S. Yamazaki","doi":"10.1109/CoolChips.2013.6547913","DOIUrl":null,"url":null,"abstract":"A processor having a power management unit (PMU) and an 8-bit CPU including flip-flops with shadow memories is fabricated by 0.5-μm Si and 0.8-μm c-axis-aligned crystalline In-Ga-Zn-oxide (CAAC-IGZO) technology. The shadow memories hold data without power supply utilizing low off-state current of CAAC-IGZO FETs. A break-even time (BET) of 4.9μs has been obtained. Good scalability of the processor in writing data to shadow memories and in area (5.7% overhead or less) is also confirmed through simulation and layout, based on flip-flops using 30-nm Si FETs combined with 0.3-μm CAAC-IGZO FETs which show good electronic characteristics and no overhead in area.","PeriodicalId":340576,"journal":{"name":"2013 IEEE COOL Chips XVI","volume":"18 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-04-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"16","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 IEEE COOL Chips XVI","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CoolChips.2013.6547913","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 16
Abstract
A processor having a power management unit (PMU) and an 8-bit CPU including flip-flops with shadow memories is fabricated by 0.5-μm Si and 0.8-μm c-axis-aligned crystalline In-Ga-Zn-oxide (CAAC-IGZO) technology. The shadow memories hold data without power supply utilizing low off-state current of CAAC-IGZO FETs. A break-even time (BET) of 4.9μs has been obtained. Good scalability of the processor in writing data to shadow memories and in area (5.7% overhead or less) is also confirmed through simulation and layout, based on flip-flops using 30-nm Si FETs combined with 0.3-μm CAAC-IGZO FETs which show good electronic characteristics and no overhead in area.