{"title":"The Thin Film Filters for the Extreme Ultraviolet Explorer Satellite","authors":"P. Vedder, J. Vallerga, O. Siegmund, R. Malina","doi":"10.1364/soa.1988.pdp1","DOIUrl":null,"url":null,"abstract":"The Extreme Ultraviolet Explorer (EUVE) satellite will conduct an all-sky survey in the extreme ultraviolet (EUV) between 80 and 900 Å. The survey mission will be performed using three grazing incidence EUV telescopes equipped with microchannel plate (MCP) detectors. A fourth telescope will provide a deeper survey over a limited portion of the sky and contains three spectrometers for pointed EUV spectroscopic observations of selected objects. Thin film filters are used directly in front of the imaging MCP detectors to define four separate photometric bandpasses for the survey and act as order filters for the spectrometers.","PeriodicalId":184695,"journal":{"name":"Space Optics for Astrophysics and Earth and Planetary Remote Sensing","volume":"41 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Space Optics for Astrophysics and Earth and Planetary Remote Sensing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1364/soa.1988.pdp1","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
The Extreme Ultraviolet Explorer (EUVE) satellite will conduct an all-sky survey in the extreme ultraviolet (EUV) between 80 and 900 Å. The survey mission will be performed using three grazing incidence EUV telescopes equipped with microchannel plate (MCP) detectors. A fourth telescope will provide a deeper survey over a limited portion of the sky and contains three spectrometers for pointed EUV spectroscopic observations of selected objects. Thin film filters are used directly in front of the imaging MCP detectors to define four separate photometric bandpasses for the survey and act as order filters for the spectrometers.