The Effects of Test-Set Distortions on Pulsed-RF Measurements

Abstract

An Acceptance Test procedure has been discussed for an automated high-power Microwave Tube Test Set. The development of test thresholds required an understanding of the MTTS capability and TUT normal and anomalous behavior. By means Paired Echo and statistical analysis, test thresholds were developed to assure software certification and MTTS Acceptance Test thresholds. During the Life Cycle of the MTTS both software/hardware changes could be certified by regression analysis using the established thresholds.