Fast life-time assessment of LED luminaries

2012 2nd IEEE CPMT Symposium Japan Pub Date : 2012-12-01 DOI:10.1109/ICSJ.2012.6523395

Daoguo Yang, M. Cai, Wenbin Chen, Zhen Zhang

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引用次数: 2

Abstract

The life-time assessment is becoming one of the major concerns for LED industry. It is highly requested to develop an effective and fast life-time qualification method to support and drive LED industry. In this paper, firstly an overview of the life-time assessment methods for LED products is conducted. A comparison has been made among the methods. Traditional constant stress accelerated test (CSAT) requires long test duration, with complication to select stress level, large sample size, high test cost and so on. The step stress accelerated test (SSAT) method has several advantages, such as suitable for long life field, short test time and few sample size, showing the potential for application to the reliability testing for LED products. Secondly, SSAT study was conducted on LED module and LED products. A design of experiments was performed based our preliminary SSAT results. Then a series of tests have been carried out. The effective accelerated degradation paths demonstrated that a fast life-time qualification procedure could be developed with step stress testing. Based on the test results, a step stress based fast life-time assessment approach is proposed for LED Products.

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LED灯具的快速寿命评估

寿命评估已成为LED产业关注的焦点之一。开发一种有效、快速的全寿命认证方法来支持和推动LED产业的发展是迫切需要的。本文首先对LED产品寿命评估方法进行了概述。对各种方法进行了比较。传统的恒应力加速测试(CSAT)具有测试时间长、应力水平选择复杂、样本量大、测试成本高等特点。台阶应力加速测试(SSAT)方法具有适用于长寿命领域、测试时间短、样本量少等优点，在LED产品可靠性测试中具有应用潜力。其次，对LED模块和LED产品进行SSAT研究。根据初步的SSAT结果进行了实验设计。然后进行了一系列的测试。有效的加速降解路径表明，通过分步应力测试可以开发出快速的寿命鉴定程序。基于测试结果，提出了一种基于阶跃应力的LED产品寿命快速评估方法。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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2012 2nd IEEE CPMT Symposium Japan

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