Effects of Anisotropic Viscoplasticity on SAC305 Solder Joint Deformation: Grain-scale Modeling of Temperature Cycling

Q. Jiang, A. Deshpande, A. Dasgupta
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引用次数: 1

Abstract

The piece-to-piece variation among Sn-based lead-free solder joints is commonly attributed to stochastic variations in grain structure and the anisotropy inherent in the body-centered tetragonal (BCT) y#-Sn lattice structure, especially for micron-scale joints that contain only a few grains. Parametric simulations of different microstructures, using grain-scale modeling, offer a convenient approach to estimate the degree of variability. Thus, although it is impossible to accurately predict the response of a given joint without knowing the microstructure, the best-case and worst-case limits of its behavior can be estimated. A crystal viscoplasticity approach has been developed to describe the anisotropic steady-state creep behavior of SAC single crystals and calibrated with results from literature and with in-house testing. The overall response of a single crystal has been characterized by a corresponding homogenized continuum-scale creep model based on Hill’s anisotropic potential, in conjunction with Norton power-law model for creep rates. In this study, the Hill-Norton model described above is applied to analyze the effect of grain orientation on the viscoplastic response and durability of a singlecrystal solder joint under the combined action of compressive and thermal cyclic loading. The predicted lifetime, based on volume-averaged creep dissipation energy density, shows 31% variation for best-case and worst-case grain orientations.
各向异性粘塑性对SAC305焊点变形的影响:温度循环的晶粒级模拟
锡基无铅焊点的片间变化通常归因于晶粒结构的随机变化和体心四边形(BCT) y#-Sn晶格结构固有的各向异性,特别是对于仅包含少量晶粒的微米尺度焊点。采用粒度模型对不同微观结构进行参数化模拟,为估计变化程度提供了一种方便的方法。因此,虽然不可能在不知道微观结构的情况下准确预测给定接头的响应,但可以估计其行为的最佳情况和最差情况极限。一种晶体粘塑性方法已经被开发出来,用来描述SAC单晶的各向异性稳态蠕变行为,并根据文献和内部测试的结果进行了校准。单晶的整体响应通过基于Hill的各向异性势的均匀连续蠕变模型来表征,并结合了蠕变速率的Norton幂律模型。本研究采用上述Hill-Norton模型,分析了在压缩和热循环载荷共同作用下,晶粒取向对单晶焊点粘塑性响应和耐久性的影响。基于体积平均蠕变耗散能量密度的预测寿命在最佳情况和最坏情况下的晶粒取向差异为31%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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