Integrated cooling for Si-based microelectronics

X. Fan, G. Zeng, C. LaBounty, D. Vashaee, J. Christofferson, A. Shakouri, J. Bowers
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引用次数: 22

Abstract

Thin film thermoelectric coolers are advantageous for their high cooling power density and their potential integrated applications. Si/sub 1-x/Ge/sub x/ is a good thermoelectric material at high temperatures and superlattice structures can further enhance the device performance. Si/sub 1-x/Ge/sub x/ and Si/sub 1-x/Ge/sub x//Si superlattice structures were grown on Si substrates using molecule beam epitaxy. Si/sub 1-x/Ge/sub x/ and Si/sub 1-x/Ge/sub x//Si superlattice thin film microcoolers with film thickness of the order of several microns were fabricated using integrated circuit processing technology. Micro thermocouples and integrated thermistor sensors were used to characterize these coolers. Maximum cooling power density on the order of hundreds of watts per square centimeter was measured at room temperature. It is possible to monolithically integrate these coolers with Si-based microelectronic devices for localized cooling and temperature stabilization.
硅基微电子集成冷却
薄膜热电冷却器具有较高的制冷功率密度和集成应用潜力。Si/sub - 1-x/Ge/sub -x/是一种良好的高温热电材料,超晶格结构可以进一步提高器件性能。采用分子束外延技术在Si衬底上生长出Si/sub - 1-x/Ge/sub -x/和Si/sub - 1-x/Ge/sub -x/ /Si超晶格结构。采用集成电路加工技术制备了Si/sub - 1-x/Ge/sub -x/和Si/sub - 1-x/Ge/sub -x/ /Si超晶格薄膜微冷却器,薄膜厚度可达几微米量级。微热电偶和集成热敏电阻传感器用于表征这些冷却器。在室温下测量了每平方厘米数百瓦的最大冷却功率密度。可以将这些冷却器与硅基微电子器件集成在一起,以实现局部冷却和温度稳定。
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