Self-consistent solution of 2D-Poisson and Schrodinger wave equation for nano-metric MOSFET modeling for VLSI/ULSI purposes

S. Dasgupta, D. Jain
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引用次数: 2

Abstract

A numerical solution of two-dimensional Poisson's equation and Schrodinger wave equation of a deep sub-micron and nano-meter MOSFET has been obtained to gather information about the charge and the potential distribution in the depletion region. The quantum as well as classical charge has been computed. The quantum charge is a direct function of Density of States (DOS). The classical charge can be found out by simply solving the two-dimensional Poisson equation under specific boundary conditions governed by the physics of the device. The channel voltage profile has also been presented. It is seen that the classical model underestimates the channel voltage and the longitudinal electric field in the channel as compared to that obtained through Quantum Mechanical (QM) approach.
用于VLSI/ULSI的纳米MOSFET建模的二维泊松和薛定谔波方程的自洽解
得到了深亚微米和纳米MOSFET二维泊松方程和薛定谔波动方程的数值解,得到了耗尽区电荷和电位分布的信息。计算了量子电荷和经典电荷。量子电荷是态密度(DOS)的直接函数。经典电荷可以通过在特定的边界条件下简单地求解二维泊松方程得到。并给出了通道电压分布图。可以看出,与量子力学(QM)方法相比,经典模型低估了通道电压和通道中的纵向电场。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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