Experimentally verified, temperature dependent physical models/parameters for power device simulation

Abstract

This paper discusses the importance of reliable physical models/parameters used in drift-diffusion device simulation of power devices. Simple devices, diodes, and considerably more complicated structures, Gate Turn-Off thyristors (GTO:s) have been investigated. Using both electrical and optical measurement techniques, comparisons have been made between measured data and simulated results. A proposal is made for new Auger recombination parameter values and for the temperature dependence of the Shockley-Read-Hall lifetime in the temperature range of 300-450 K.