Fault diagnosis of a GHz CMOS LNA using high-speed ADC-based BIST

Proceedings. 2004 IEEE International Workshop on Current and Defect Based Testing (IEEE Cat. No.04EX1004) Pub Date : 2004-04-05 DOI:10.1109/DBT.2004.1408964

J. Liobe, M. Margala

引用次数: 8

Abstract

This paper presents a fault isolation method using the digital signatures from a LNA BIST solution. The fault localization capabilities of the functional test and data analysis methods are demonstrated by circuit level simulation. Also a discussion of the efficacy of this method is given. Results showed that only 16% of the resistive faults examined here cannot be mapped to its specification location in the LNA.

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基于高速adc的BIST的GHz CMOS LNA故障诊断

本文提出了一种基于数字签名的LNA BIST故障隔离方法。通过电路级仿真，验证了功能测试和数据分析方法的故障定位能力。并对该方法的有效性进行了讨论。结果表明，这里检查的电阻性故障中只有16%不能映射到其在LNA中的规范位置。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Proceedings. 2004 IEEE International Workshop on Current and Defect Based Testing (IEEE Cat. No.04EX1004)

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