Y. Illarionov, A. Banshchikov, T. Knobloch, D. Polyushkin, S. Wachter, V. Fedorov, S. Suturin, M. Stöger-Pollach, T. Mueller, M. Vexler, N. Sokolov, T. Grasser
{"title":"Crystalline Calcium Fluoride: A Record-Thin Insulator for Nanoscale 2D Electronics","authors":"Y. Illarionov, A. Banshchikov, T. Knobloch, D. Polyushkin, S. Wachter, V. Fedorov, S. Suturin, M. Stöger-Pollach, T. Mueller, M. Vexler, N. Sokolov, T. Grasser","doi":"10.1109/DRC50226.2020.9135160","DOIUrl":null,"url":null,"abstract":"Two-dimensional (2D) electronics can enable FETs down to a few nanometers. However, these devices require scalable insulators which should form high-quality interfaces with 2D channels and maintain low gate leakage currents for sub-1nm equivalent oxide thickness (EOT). Previously used amorphous oxides result in poor interfaces with 2D materials, while hBN has mediocre dielectric properties ( ε < 5, E g = 6eV) [1] . As a promising alternative, we suggest the use of the crystalline ionic insulator CaF 2 ( ε = 8.43, E g = 12.1eV) which forms van der Waals interfaces with 2D semiconductors [2] . At the moment, CaF 2 can be grown by molecular-beam epitaxy (MBE) down to a few nanometers thickness [3] and appears promising for chemical vapour deposition (CVD) [4] and atomic-layer deposition (ALD) [5] . Here we discuss our recent progress [3] , [6] , [7] on ultra-thin CaF 2 which presents a universal platform for 2D devices. In particular, we demonstrate nanoscale MoS 2 FETs with L =50-60nm and a record-thin ~ 2nm CaF 2 insulator (EOT~ 0.9nm) which exhibits near-ideal subthreshold swing (SS).","PeriodicalId":397182,"journal":{"name":"2020 Device Research Conference (DRC)","volume":"64 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 Device Research Conference (DRC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DRC50226.2020.9135160","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
Two-dimensional (2D) electronics can enable FETs down to a few nanometers. However, these devices require scalable insulators which should form high-quality interfaces with 2D channels and maintain low gate leakage currents for sub-1nm equivalent oxide thickness (EOT). Previously used amorphous oxides result in poor interfaces with 2D materials, while hBN has mediocre dielectric properties ( ε < 5, E g = 6eV) [1] . As a promising alternative, we suggest the use of the crystalline ionic insulator CaF 2 ( ε = 8.43, E g = 12.1eV) which forms van der Waals interfaces with 2D semiconductors [2] . At the moment, CaF 2 can be grown by molecular-beam epitaxy (MBE) down to a few nanometers thickness [3] and appears promising for chemical vapour deposition (CVD) [4] and atomic-layer deposition (ALD) [5] . Here we discuss our recent progress [3] , [6] , [7] on ultra-thin CaF 2 which presents a universal platform for 2D devices. In particular, we demonstrate nanoscale MoS 2 FETs with L =50-60nm and a record-thin ~ 2nm CaF 2 insulator (EOT~ 0.9nm) which exhibits near-ideal subthreshold swing (SS).