{"title":"The Determinations of Pb, Cd, Hg, Cr6+, PBBs/PBDEs to Comply with RoHS Directive","authors":"L. Hua, Y.P. Wu, B. An, Y. Chan, B.Y. Wu, F.S. Wu","doi":"10.1109/ICEPT.2007.4441478","DOIUrl":null,"url":null,"abstract":"For RoHS compliance, a method coupled inductively coupled plasma-optical emission spectrometry (ICP-OES), gas chromatography-mass spectrometry (GC-MS), and UV-visible spectrophotometry with microwave technology was developed to determine trace Cd, Hg, Pb, Cr6+, PBBs/PBDEs in electronic and electrical products (EEP). Elements were screened by Energy dispersion X-ray fluorescence spectrometry (EDXRF). In order to achieve good performance, other methods such as colorific test, inter-element correction (IEC) and standard addition techniques etc. were performed. By this study, it showed that analyses of Hg, Cd, Pb by ICP-OES and Cr6+ by UV-visible spectrophotometry had a RSD <5%, and a RSD <1% for PBBs/PBDEs by GC-MS analyzer. UV-visible spectrophotometry offered a good alternative for Cr6+ determination with alkali digestion, the inferences from Fe3+, Pb2+ etc. were eliminated by K2HPO4 buffer. The ramifications from monoBB/BDE to DecaBB/BDE were distinctly separated and successfully determined in the optimized condition. Furthermore, microwave system did an excellent job of consistently putting solid samples into solutions and had a moderate compatibility with spectrometric analyzer due to good recoveries. Though RSD of XRF screening was larger than 10%, it proved to be an easier, cheaper, faster technique. Because of the combination of multiple methodologies, the restricted substances can be determined with good precision and high reliability. It provides a prominent project for EE industries to comply with RoHS compliance.","PeriodicalId":325619,"journal":{"name":"2007 8th International Conference on Electronic Packaging Technology","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 8th International Conference on Electronic Packaging Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICEPT.2007.4441478","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
For RoHS compliance, a method coupled inductively coupled plasma-optical emission spectrometry (ICP-OES), gas chromatography-mass spectrometry (GC-MS), and UV-visible spectrophotometry with microwave technology was developed to determine trace Cd, Hg, Pb, Cr6+, PBBs/PBDEs in electronic and electrical products (EEP). Elements were screened by Energy dispersion X-ray fluorescence spectrometry (EDXRF). In order to achieve good performance, other methods such as colorific test, inter-element correction (IEC) and standard addition techniques etc. were performed. By this study, it showed that analyses of Hg, Cd, Pb by ICP-OES and Cr6+ by UV-visible spectrophotometry had a RSD <5%, and a RSD <1% for PBBs/PBDEs by GC-MS analyzer. UV-visible spectrophotometry offered a good alternative for Cr6+ determination with alkali digestion, the inferences from Fe3+, Pb2+ etc. were eliminated by K2HPO4 buffer. The ramifications from monoBB/BDE to DecaBB/BDE were distinctly separated and successfully determined in the optimized condition. Furthermore, microwave system did an excellent job of consistently putting solid samples into solutions and had a moderate compatibility with spectrometric analyzer due to good recoveries. Though RSD of XRF screening was larger than 10%, it proved to be an easier, cheaper, faster technique. Because of the combination of multiple methodologies, the restricted substances can be determined with good precision and high reliability. It provides a prominent project for EE industries to comply with RoHS compliance.