Effectiveness of I-V testing in comparison to IDDq tests [IC testing]

Abstract

This paper contrasts the novel I-V test criteria with traditional and recent IDDq test methods and compares their test effectiveness. It shows how I-V tests and IDDq tests fare in discriminating between "good" and "bad" dies and how test limits can be set empirically, especially for I-V testing. All results are based on data from an (internal) IBM experiment that was based on a large ASIC manufactured in a 0.18 /spl mu/m-L/sub eff/ technology.