A Sub 1V CMOS LNA dedicated to 802.11b/g applications with self-test & high reliability capabilities

Abstract

A low noise amplifier designed in a 0.13 mum CMOS technology, which has self-test and high reliability capabilities, is presented. Such a LNA could be used in the design of front-end of critical nodes in wireless local area networks to ensure the data transmission. The test of the LNA is based on a built-in self test methodology that permits to monitor its behavior and its reliability is ensured by the use of redundancies. The LNA works under a 0.9 V supply voltage and the test chip has characteristics suitable for 802.11 b/g applications. Parametric faults are injected and detected that demonstrate the efficiency of the BIST circuitry. Switching on each redundant block has proven that the LNA keeps its performances.