Photoenhanced wet etching of n-gallium nitride

J. Škriniarová, M. Michalka, F. Uherek, P. Kordos
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引用次数: 1

Abstract

Photoassisted electrochemical (PEC) etching of n-doped GaN layer grown on sapphire in a KOH based solution under illumination of a Hg arc lamp is demonstrated. Smooth surfaces were obtained for a narrow range of etching conditions. It was found that this window could be extended by using etch conditions which produced "whiskers". Subsequent post treatment in developer AZ 400 K and KOH solution was used to remove these whiskers. An influence of the surface treatment of GaN by wet chemical etching prior to the Schottky barrier metal deposition was investigated.
氮化镓的光增强湿法蚀刻
研究了在汞弧灯照射下,在KOH基溶液中生长的蓝宝石上n掺杂氮化镓层的光辅助电化学蚀刻。在狭窄的蚀刻条件下获得了光滑的表面。发现这个窗口可以通过使用产生“晶须”的蚀刻条件来延长。随后在显影剂az400k和KOH溶液中进行后处理,以去除这些晶须。研究了在肖特基势垒金属沉积前,湿法化学蚀刻对氮化镓表面处理的影响。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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