Proton irradiation of various resistivity silicon detectors

S. Bates, B. Dezillie, C. Furetta, M. Glaser, F. Lemeilleur, E. León-Florián
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引用次数: 21

Abstract

Future high energy physics experiments at CERN's Large Hadron Collider will use high precision silicon detectors for tracking purposes. The hadronic component of the radiation received threatens the lifetime of these detectors and it is vital to choose the silicon starting material to maximise the performance and lifetime. Ion-implanted silicon detectors with various initial resistivities and germanium concentrations have been irradiated with high energy protons up to a fluence of 10/sup 14/ cm/sup -2/. The change in leakage current and full depletion voltage have been studied both as a function of fluence and of time after irradiation. Measurements were made up to 100 days post-irradiation at room temperature and then using heating techniques to accelerate processes up to the equivalent of over 10 years at room temperature. The leakage-current damage constant is shown to be independent of the starting material while the conduction type inversion point and the long-term annealing of the depletion voltage are sensitive to the initial resistivity and impurity concentrations.
各种电阻率硅探测器的质子辐照
未来在欧洲核子研究中心的大型强子对撞机进行的高能物理实验将使用高精度硅探测器进行跟踪。所接收的辐射的强子成分威胁到这些探测器的寿命,因此选择硅起始材料以最大限度地提高性能和寿命至关重要。具有不同初始电阻率和锗浓度的离子注入硅探测器已被高能质子照射至10/sup 14/ cm/sup -2/。研究了辐照后泄漏电流和完全耗尽电压随辐照通量和辐照时间的变化规律。在室温下辐照后100天进行测量,然后使用加热技术加速过程,相当于在室温下超过10年。漏电流损伤常数与起始材料无关,而导型反转点和耗尽电压的长期退火对初始电阻率和杂质浓度敏感。
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