A 10-bit 30MS/s Subranging SAR ADC with a Triple Reference Voltage Technique

Pao-Hua Liao, Wei Wu, Yuh-Shvan Hwang
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Abstract

This paper presents a 10-bit subrange analog-to-digital converter (ADC) consisting of a 3-bit coarse successive-approximation-register (SAR) ADC, a 7-bit fine SAR ADC, and two sets of the binary-weighted capacitor arrays digital-to-analog converter (DAC) using a new technique of triple reference voltage. The smaller MSB capacitor improves the operating speed of the coarse SAR ADC due to less charge redistribution time. The proposed 10-bit SAR ADC is implemented in the TSMC 0.18 μm CMOS technology with a power supply of 1.8V. The effective number of bits (ENOB) is 8.29 bit, the sampling rate achieves at 30 MS/s. Both theoretical analysis and behavioral simulations show that the differential non-linearity (DNL) of a SAR ADC with segmented DAC is better than that of a binary ADC. Consequently, compared with conventional SAR ADC without any calibration, the proposed efficient capacitor switching technology can shorten the conversion time of the previous cycle and lower the switching energy.
采用三基准电压技术的10位30MS/s Subranging SAR ADC
本文提出了一种采用三基准电压新技术的10位子范围模数转换器(ADC),该转换器由一个3位粗连续逼近寄存器(SAR) ADC、一个7位精细SAR ADC和两组二值加权电容阵列数模转换器(DAC)组成。较小的MSB电容器由于较少的电荷重新分配时间而提高了粗SAR ADC的工作速度。所提出的10位SAR ADC采用台积电0.18 μm CMOS技术,电源为1.8V。有效比特数(ENOB)为8.29比特,采样率达到30 MS/s。理论分析和行为仿真均表明,分段DAC的SAR ADC的差分非线性优于二元ADC。因此,与传统的无需校准的SAR ADC相比,所提出的高效电容开关技术可以缩短前一个周期的转换时间,降低开关能量。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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