Training, Programming, and Correction Techniques of Memristor-Crossbar Neural Networks with Non-Ideal Effects such as Defects, Variation, and Parasitic Resistance

T. Nguyen, J. An, Seokjin Oh
{"title":"Training, Programming, and Correction Techniques of Memristor-Crossbar Neural Networks with Non-Ideal Effects such as Defects, Variation, and Parasitic Resistance","authors":"T. Nguyen, J. An, Seokjin Oh","doi":"10.1109/ASICON52560.2021.9620330","DOIUrl":null,"url":null,"abstract":"Memristor crossbars can be useful in realizing high-performance and low-power computing hardware especially for realizing edge-intelligence. Unfortunately, however, they have non-ideal effects such as memristor defects, conductance variation, parasitic resistance, etc. For compensating these non-ideal effects, various techniques should be used in implementing neural networks with memristor crossbars. More specifically, the memristor defects should be considered in the training process using defect map. The variation in programmed memristor’s conductance can be suppressed using the fine programming method of memristors. Moreover, to reduce errors of crossbar’s currents and voltages due to parasitic resistance, the correction circuit can be added to the crossbar peripheral. In this paper, these techniques are explained and verified to be able to minimize the recognition rate loss due to the non-ideal effects in the memristor crossbar.","PeriodicalId":233584,"journal":{"name":"2021 IEEE 14th International Conference on ASIC (ASICON)","volume":"68 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-10-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE 14th International Conference on ASIC (ASICON)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASICON52560.2021.9620330","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4

Abstract

Memristor crossbars can be useful in realizing high-performance and low-power computing hardware especially for realizing edge-intelligence. Unfortunately, however, they have non-ideal effects such as memristor defects, conductance variation, parasitic resistance, etc. For compensating these non-ideal effects, various techniques should be used in implementing neural networks with memristor crossbars. More specifically, the memristor defects should be considered in the training process using defect map. The variation in programmed memristor’s conductance can be suppressed using the fine programming method of memristors. Moreover, to reduce errors of crossbar’s currents and voltages due to parasitic resistance, the correction circuit can be added to the crossbar peripheral. In this paper, these techniques are explained and verified to be able to minimize the recognition rate loss due to the non-ideal effects in the memristor crossbar.
具有缺陷、变异和寄生电阻等非理想效应的记忆电阻-交叉棒神经网络的训练、编程和校正技术
忆阻交叉栅可用于实现高性能、低功耗的计算硬件,特别是边缘智能的实现。然而,不幸的是,它们具有非理想的影响,如忆阻器缺陷,电导变化,寄生电阻等。为了补偿这些非理想效应,在实现具有忆阻交叉栅的神经网络时需要使用各种技术。更具体地说,应该在使用缺陷图的训练过程中考虑忆阻器缺陷。采用忆阻器的精细编程方法可以抑制已编程忆阻器电导的变化。此外,为了减小由于寄生电阻而造成的横杆电流和电压误差,可以在横杆外设上增加校正电路。本文对这些技术进行了解释和验证,证明这些技术能够最大限度地降低由于忆阻器横条中的非理想效应而导致的识别率损失。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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