Development of open architecture test systems

Tang Diyin, Jinsong Yu, Chen Xiongzi, Wang Honglun
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引用次数: 1

Abstract

Next generation test system tends to be more dependent on open architecture, in order to address reusability and interoperability of test solutions. This paper provides a framework of open-architecture test systems, not only realizing the fundamental modularization and integration in a general open-architecture, but also reinforcing the interchangeability of TPS & instruments, as well as parallel development of test software by ATE software technologies. Basic structure, realization details, and a case study are presented in this paper to demonstrate its feasibility and prospective for a wide range of applications.
开发开放式体系结构测试系统
为了解决测试方案的可重用性和互操作性,下一代测试系统倾向于更加依赖于开放的体系结构。本文提出了一个开放体系结构的测试系统框架,不仅实现了通用开放体系结构下的基本模块化和集成化,而且增强了TPS与仪器的互换性,并利用ATE软件技术实现了测试软件的并行开发。本文介绍了该系统的基本结构、实现细节和应用实例,说明了该系统的可行性和广泛应用前景。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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