Greicy Marques-Costa, W. Mansour, F. Pancher, R. Velazco, A. Bui, D. Sohier
{"title":"Optimization of a self-converging algorithm at assembly level to improve SEU fault-tolerance","authors":"Greicy Marques-Costa, W. Mansour, F. Pancher, R. Velazco, A. Bui, D. Sohier","doi":"10.1109/LASCAS.2013.6519033","DOIUrl":null,"url":null,"abstract":"The robustness with respect to SEUs (Single-Event Upset) of a self-converging algorithm is improved by fault-tolerance techniques implemented at software level. SEU-sensitivity evaluation was done by fault injection campaigns performed using a devoted test platform. Experimental results show that implementing fault-tolerance by modifying the assembly code leads to significant improvements of the fault tolerance.","PeriodicalId":190693,"journal":{"name":"2013 IEEE 4th Latin American Symposium on Circuits and Systems (LASCAS)","volume":"62 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 IEEE 4th Latin American Symposium on Circuits and Systems (LASCAS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/LASCAS.2013.6519033","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
The robustness with respect to SEUs (Single-Event Upset) of a self-converging algorithm is improved by fault-tolerance techniques implemented at software level. SEU-sensitivity evaluation was done by fault injection campaigns performed using a devoted test platform. Experimental results show that implementing fault-tolerance by modifying the assembly code leads to significant improvements of the fault tolerance.