Differential evolutionary optimization algorithm applied to ESD MOSFET model fitting problem

Abstract

The aim of this paper is to present the utilization of modern optimization algorithm called Differential Evolution to automatically fit the appropriate Electrostatic discharge (ESD) model to the measured data from a test chip without the need of manual model-parameter tuning, which presents very time and resource-consuming process. In this paper, the optimization procedure and the results of fitting the generic process NMOST model to the piece-wise linear I-V characteristic are presented.