{"title":"Formal verification of fail-safeness of a comparator for redundant system using regular temporal logic","authors":"K. Kawakubo, H. Hiraishi","doi":"10.1109/ATS.1992.224426","DOIUrl":null,"url":null,"abstract":"The authors propose a method of formal verification of fault-tolerance of sequential machines using regular temporal logic. In this method, fault-tolerant properties are described in the form of input-output sequences in regular temporal logic formulas and they are formally verified by checking if they hold for all possible input-output sequences of the machine. The authors illustrate the method of its application for formal verification of fail-safeness with an example of a comparator for redundant system. The result of verification shows effectiveness of the proposed method.<<ETX>>","PeriodicalId":208029,"journal":{"name":"Proceedings First Asian Test Symposium (ATS `92)","volume":"21 5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-11-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings First Asian Test Symposium (ATS `92)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.1992.224426","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
The authors propose a method of formal verification of fault-tolerance of sequential machines using regular temporal logic. In this method, fault-tolerant properties are described in the form of input-output sequences in regular temporal logic formulas and they are formally verified by checking if they hold for all possible input-output sequences of the machine. The authors illustrate the method of its application for formal verification of fail-safeness with an example of a comparator for redundant system. The result of verification shows effectiveness of the proposed method.<>