Tricks of the light

L. Collins, C. Edwards
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引用次数: 4

Abstract

Physical IC design keeps getting more difficult as efforts to extend optical lithography beyond the 65nm generation impose limits on layouts. Process engineers have decided that they are stuck with the type of ultraviolet light that they use today in chipmaking for at least the next couple of generations of chip technology. The 193nm wavelength appeared with the 90nm process just as research on 157nm wound up because of problems with lenses and resists. That means the wavelength of light used to draw features on a chip is several times larger than the features themselves. As minimum process dimensions have shrunk to even smaller fractions of the illumination wavelength, various post-layout optimizations have been introduced to compensate for diffraction effects that result. Optical proximity correction techniques ensure that very closely spaced layout features can be formed on the wafer, by taking account of the way that light patterning one feature interferes with light patterning its neighbor. These corrections have been joined by other resolution enhancement techniques that continue to put pressure on designers to conform to increasingly complicated rules. At the same time, the techniques make the relationship between the original layout and what appears on the wafer less certain.
光的把戏
物理IC设计变得越来越困难,因为将光学光刻技术扩展到65nm以上的努力对布局施加了限制。工艺工程师们已经决定,至少在接下来的几代芯片技术中,他们将继续使用目前在芯片制造中使用的紫外光。随着90nm工艺的出现,出现了193nm波长,而157nm工艺的研究却因为透镜和抗蚀剂的问题而告一段落。这意味着用于在芯片上绘制特征的光的波长是特征本身的几倍。由于最小工艺尺寸缩小到照明波长的更小部分,各种布局后优化已经引入,以补偿由此产生的衍射效应。光学接近校正技术通过考虑到一个特征的光图案干扰其相邻的光图案的方式,确保在晶圆上形成非常紧密间隔的布局特征。这些修正与其他分辨率增强技术一起,继续给设计师施加压力,要求他们遵守日益复杂的规则。同时,这些技术使得原始布局与晶圆上的表现之间的关系变得不那么确定。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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