Enhancement of MCM testability using an embedded reconfigurable FPGA

Abstract

The testability of an MCM can be enhanced significantly for very little cost whenever a reprogrammable FPGA component that is already embedded in the MCM for functionality is utilized for diagnostics. This approach can have some of the characteristics of a smart substrate which uses the scan cell beside-the-signal-path (BSP) methodology. The design and implementation of an MCM with this capability is presented along with descriptions of the self-test algorithms, fault isolation and real-time testing and monitoring that this method provides.