A HW-dependent software model for cross-layer fault analysis in embedded systems

C. Bartsch, Nico Rödel, Carlos Villarraga, D. Stoffel, W. Kunz
{"title":"A HW-dependent software model for cross-layer fault analysis in embedded systems","authors":"C. Bartsch, Nico Rödel, Carlos Villarraga, D. Stoffel, W. Kunz","doi":"10.1109/LATW.2016.7483356","DOIUrl":null,"url":null,"abstract":"With the advent of new microelectronic fabrication technologies new hardware devices are emerging which suffer from an intrinsically higher susceptibility to faults than previous devices. This leads to a substantially lower degree of reliability and demands further improvements of error detection methods. However, any attempt to cover all errors for all theoretically possible scenarios that a system might be used in can easily lead to excessive costs. Instead, an application-dependent approach should be taken, i.e., strategies for test and error resilience must target only those errors that can actually have an effect in the situations in which the hardware is being used. In this paper, we propose a method to inject faults into hardware and to formally analyze their effects on the software behavior. We describe how this analysis can be implemented based on a recently proposed hardware-dependent software model called program netlist. We show how program netlists can be extended to formally model the behavior of a program in the event of one or more hardware faults. First experimental results are presented to demonstrate the feasibility of our approach.","PeriodicalId":135851,"journal":{"name":"2016 17th Latin-American Test Symposium (LATS)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-04-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 17th Latin-American Test Symposium (LATS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/LATW.2016.7483356","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3

Abstract

With the advent of new microelectronic fabrication technologies new hardware devices are emerging which suffer from an intrinsically higher susceptibility to faults than previous devices. This leads to a substantially lower degree of reliability and demands further improvements of error detection methods. However, any attempt to cover all errors for all theoretically possible scenarios that a system might be used in can easily lead to excessive costs. Instead, an application-dependent approach should be taken, i.e., strategies for test and error resilience must target only those errors that can actually have an effect in the situations in which the hardware is being used. In this paper, we propose a method to inject faults into hardware and to formally analyze their effects on the software behavior. We describe how this analysis can be implemented based on a recently proposed hardware-dependent software model called program netlist. We show how program netlists can be extended to formally model the behavior of a program in the event of one or more hardware faults. First experimental results are presented to demonstrate the feasibility of our approach.
基于hw的嵌入式系统跨层故障分析软件模型
随着新的微电子制造技术的出现,新的硬件设备不断涌现,这些硬件设备比以前的设备具有更高的故障敏感性。这导致可靠性大大降低,需要进一步改进错误检测方法。然而,任何试图覆盖系统可能用于的所有理论上可能场景的所有错误的尝试都很容易导致过高的成本。相反,应该采用依赖于应用程序的方法,也就是说,测试和错误恢复策略必须只针对那些在使用硬件的情况下实际上会产生影响的错误。本文提出了一种将故障注入硬件并形式化分析其对软件行为影响的方法。我们描述了如何基于最近提出的一种称为程序网表的硬件相关软件模型来实现这种分析。我们展示了如何扩展程序网络列表,以便在发生一个或多个硬件故障时正式建模程序的行为。第一个实验结果证明了我们方法的可行性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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