Learning Electrical Behavior of Core Interconnects for System-Level Crosstalk Prediction

Katayoon Basharkhah, Raheleh Sadat Mirhashemi, Nooshin Nosrati, Mohammad-Javad Zare, Z. Navabi
{"title":"Learning Electrical Behavior of Core Interconnects for System-Level Crosstalk Prediction","authors":"Katayoon Basharkhah, Raheleh Sadat Mirhashemi, Nooshin Nosrati, Mohammad-Javad Zare, Z. Navabi","doi":"10.1109/ETS56758.2023.10173987","DOIUrl":null,"url":null,"abstract":"Efficient distribution of tasks in an SOC between various components of an embedded system affect rate of data exchange between cores and obviously the number and fanout of interconnecting cores. Data rate and interconnect fanouts depend on post-layout wire characteristics that, in the worst-case situation, must be evaluated for abovementioned system level decisions. In this work we are making provisions for avoiding this large gap between high-level decision making and low-level physical properties. IP-core interconnects can be fully characterized by post layout information of the IP-core, load properties, and the number of destination cores they are driving. This information can be back-annotated into abstract system-level interconnect models to be used by core integrators for design space exploration (DSE). Fanout and/or frequency of operation of an IP-core can be decided by this DSE environment. In this work, we propose a machine-learning based methodology that uses signoff parasitic information and the actual wire data to generate the dataset and train a model. The model was evaluated in fast high-level SystemC environment for two RISC-V based processors in two SoCs. The models were 26 times faster than the low-level simulations with a crosstalk fault coverage of 1.5% error.","PeriodicalId":211522,"journal":{"name":"2023 IEEE European Test Symposium (ETS)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2023-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2023 IEEE European Test Symposium (ETS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ETS56758.2023.10173987","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

Efficient distribution of tasks in an SOC between various components of an embedded system affect rate of data exchange between cores and obviously the number and fanout of interconnecting cores. Data rate and interconnect fanouts depend on post-layout wire characteristics that, in the worst-case situation, must be evaluated for abovementioned system level decisions. In this work we are making provisions for avoiding this large gap between high-level decision making and low-level physical properties. IP-core interconnects can be fully characterized by post layout information of the IP-core, load properties, and the number of destination cores they are driving. This information can be back-annotated into abstract system-level interconnect models to be used by core integrators for design space exploration (DSE). Fanout and/or frequency of operation of an IP-core can be decided by this DSE environment. In this work, we propose a machine-learning based methodology that uses signoff parasitic information and the actual wire data to generate the dataset and train a model. The model was evaluated in fast high-level SystemC environment for two RISC-V based processors in two SoCs. The models were 26 times faster than the low-level simulations with a crosstalk fault coverage of 1.5% error.
用于系统级串扰预测的核心互连电行为学习
在嵌入式系统的SOC中,任务在各个组件之间的有效分配会影响内核之间的数据交换速率,并明显影响互连内核的数量和扇出。数据速率和互连扇出取决于布线后的电线特性,在最坏的情况下,必须对上述系统级决策进行评估。在这项工作中,我们正在为避免高层决策和低层物理性质之间的巨大差距做准备。ip核互连可以通过ip核的后布局信息、负载属性和它们正在驱动的目标核的数量来充分表征。这些信息可以反向注释到抽象的系统级互连模型中,供核心集成商用于设计空间探索(DSE)。扇出和/或ip核的操作频率可以由这个DSE环境决定。在这项工作中,我们提出了一种基于机器学习的方法,该方法使用签名寄生信息和实际线数据来生成数据集并训练模型。该模型在两个soc的两个RISC-V处理器的快速高级SystemC环境中进行了评估。模型速度是低阶模拟的26倍,串扰故障覆盖率为1.5%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信