{"title":"Un-powered thermal memory protection for circuit breakers","authors":"J. Lagree, C. Walker","doi":"10.1109/PAPCON.2010.5556498","DOIUrl":null,"url":null,"abstract":"The National Fire Protection Association (NFPA) 70, National Electrical Code contains extensive information and requirements for overcurrent protection and temperature limitations of conductors. Thermal-magnetic trip units in circuit breakers provide protection for overloads and short circuit faults in electrical distribution systems. The magnetic element protects against short circuit faults and a bimetal element protects against overloaded thermal conditions. Electronic trip units use microprocessors, electronic devices and software algorithms to provide the equivalent bi-metallic response of thermal-magnetic trip units. If the electronic trip unit does not contain unpowered thermal memory circuitry the protection is then not equivalent to the bimetal trip unit.","PeriodicalId":182346,"journal":{"name":"Conference Record of 2010 Annual Pulp & Paper Industry Technical Conference","volume":"6 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-06-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Conference Record of 2010 Annual Pulp & Paper Industry Technical Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PAPCON.2010.5556498","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
The National Fire Protection Association (NFPA) 70, National Electrical Code contains extensive information and requirements for overcurrent protection and temperature limitations of conductors. Thermal-magnetic trip units in circuit breakers provide protection for overloads and short circuit faults in electrical distribution systems. The magnetic element protects against short circuit faults and a bimetal element protects against overloaded thermal conditions. Electronic trip units use microprocessors, electronic devices and software algorithms to provide the equivalent bi-metallic response of thermal-magnetic trip units. If the electronic trip unit does not contain unpowered thermal memory circuitry the protection is then not equivalent to the bimetal trip unit.