Analysis and Measurement of Spurious Emission and Phase Noise Performance of an RF All-Digital Phase Locked Loop using a Frequency Discriminator

Abstract

A frequency discriminator in all-digital phase locked loops (ADPLLs) for RF-synthesis has to fulfill several tough requirements. The most important requirements are the in-band phase noise performance and knowledge about offset frequencies of the spurious emissions, because the ADPLL should fulfill several wireless communication standard requirements like UMTS and GSM. This paper presents a theoretical derivation, simulative analysis, and measurement results for the in-band phase noise level and the offset frequencies of spurious emissions of an ADPLL with a two-bit Frequency Discriminator implemented in a standard 0.13 mum CMOS technology