Degradation kinetics of amorphous silicon solar cells processed at high pressure and its relation to the nanostructure

M. Fischer, Robin J. V. Quax, M. Zeman, A. Smets
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引用次数: 9

Abstract

In this study it is revealed that the light induced defects (LIDs) responsible for the fast degradation of hydrogenated amorphous silicon (a-Si:H) solar cells under light soaking are located at nanosized voids. This important breakthrough in identifying the local environment of LIDs has been achieved by detailed study of the relation between the nanostructure of a-Si:H and metastability of corresponding solar cell devices under light soaking. We propose that a useful tool to define the nanostructure of a-Si:H is to determine the size distribution of the volume deficiencies, which range from small hydrogenated vacancies up to nanosized voids. The processing window used to vary and control the nanostructure in dense a-Si:H is based on a hydrogen rich plasma at unconventional high processing pressures (~10 mbar). The dense absorber layers with different distributions of volume deficiencies are subsequently incorporated in solar cell devices. For the first time a clear relation between nanostructures of the a-Si:H absorber layer and the fast kinetics of the metastable LIDs of the solar cell during light soaking and thermal annealing is observed. The `fast' degradation (first 10 hours of light soaking) strongly correlates to the density of largest volume deficiencies in the a-Si:H matrix. The “slow” regime (10 tot 1000 hours of light soaking) appears to be independent on the nanostructure of the absorber layer. In addition, the fast metastable defect states are the first ones to be annealed out at relative low annealing temperatures (120-130 C). Although solar cells processed at higher pressure have the same long term degradation kinetics, their FF recovers much faster by thermal annealing when compared to the cells processed at standard low pressure and low hydrogen dilution conditions.
非晶硅太阳能电池高压降解动力学及其与纳米结构的关系
本研究揭示了导致氢化非晶硅(a-Si:H)太阳能电池在光浸泡下快速降解的光致缺陷(LIDs)位于纳米级的空隙中。通过详细研究a-Si:H纳米结构与相应太阳能电池器件在光浸泡下亚稳性之间的关系,实现了识别LIDs局部环境的重要突破。我们提出了一个有用的工具来定义a- si:H的纳米结构是确定体积缺陷的大小分布,其范围从小的氢化空位到纳米尺寸的空隙。用于改变和控制致密a- si:H纳米结构的加工窗口是基于非常规高加工压力(~10毫巴)下的富氢等离子体。具有不同体积缺陷分布的致密吸收层随后被纳入太阳能电池器件中。首次观察到a- si:H吸收层的纳米结构与太阳能电池在光浸泡和热退火过程中亚稳盖的快速动力学之间的明确关系。“快速”降解(光浸泡前10小时)与a-Si:H基体中最大体积缺陷的密度密切相关。“慢”状态(10到1000小时的光浸泡)似乎与吸收层的纳米结构无关。此外,快速亚稳态缺陷态是在相对较低的退火温度(120-130℃)下首先退火出来的。尽管在较高压力下处理的太阳能电池具有相同的长期降解动力学,但与在标准低压和低氢稀释条件下处理的电池相比,它们的FF通过热退火恢复得更快。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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