{"title":"Electrical properties of co-fired high and low dielectric constant multilayer package materials","authors":"M. Megherhi, J. Dougherty, G. Dayton, R. Newnham","doi":"10.1109/ISAF.1990.200194","DOIUrl":null,"url":null,"abstract":"The problems encountered in mixing high-dielectric-constant (high-K) lead-oxide-based capacitor layers in the same body as low-dielectric-permittivity (low-K) signal distribution layers were studied. Compatibility between the high-K capacitor material and low-fire (850-950 degrees C) glass-Al/sub 2/O/sub 3/ substrates was investigated. Most high-K ceramic materials sinter at temperatures above 1000 degrees C; firing at 900 degrees C or lower can result in a porous structure with poor electrical properties.<<ETX>>","PeriodicalId":269368,"journal":{"name":"[Proceedings] 1990 IEEE 7th International Symposium on Applications of Ferroelectrics","volume":"46 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1990-06-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"[Proceedings] 1990 IEEE 7th International Symposium on Applications of Ferroelectrics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISAF.1990.200194","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
The problems encountered in mixing high-dielectric-constant (high-K) lead-oxide-based capacitor layers in the same body as low-dielectric-permittivity (low-K) signal distribution layers were studied. Compatibility between the high-K capacitor material and low-fire (850-950 degrees C) glass-Al/sub 2/O/sub 3/ substrates was investigated. Most high-K ceramic materials sinter at temperatures above 1000 degrees C; firing at 900 degrees C or lower can result in a porous structure with poor electrical properties.<>