Lou Shichao, F. Ruan, Su Ming, Wang Tuo, Wang Heng, Xiao Wenjun, Zhi Qijun
{"title":"Gap detecting system design for measurement system of non-contact electrostatic discharge","authors":"Lou Shichao, F. Ruan, Su Ming, Wang Tuo, Wang Heng, Xiao Wenjun, Zhi Qijun","doi":"10.1109/ICASID.2016.7873922","DOIUrl":null,"url":null,"abstract":"Non-contact electrostatic discharge(ESD) taken popularly place in many situations, of military weapon, industrial product, aerospace vehicle, and even in people daily living. Discharge current pulse in non-contact electrostatic discharge with small gap has rise time in nanoseconds, produced wide band disturbance, hence may resulted in serious threat or even damage to microelectronic systems and electronic products. A new electrostatic discharge test system has been designed and made to test electrostatic discharge with different gaps, so as to research their strong influence on discharge result. A design of gap-measuring was proposed for the new ESD test system. Based on the module proposed test data was sent to PLC and and be compared with the position. Discharge current corresponding to each discharge gap was simultaneously measured and analysed, aiming to improve quantitative research of non-contact ESD properties.","PeriodicalId":294777,"journal":{"name":"2016 10th IEEE International Conference on Anti-counterfeiting, Security, and Identification (ASID)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 10th IEEE International Conference on Anti-counterfeiting, Security, and Identification (ASID)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICASID.2016.7873922","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Non-contact electrostatic discharge(ESD) taken popularly place in many situations, of military weapon, industrial product, aerospace vehicle, and even in people daily living. Discharge current pulse in non-contact electrostatic discharge with small gap has rise time in nanoseconds, produced wide band disturbance, hence may resulted in serious threat or even damage to microelectronic systems and electronic products. A new electrostatic discharge test system has been designed and made to test electrostatic discharge with different gaps, so as to research their strong influence on discharge result. A design of gap-measuring was proposed for the new ESD test system. Based on the module proposed test data was sent to PLC and and be compared with the position. Discharge current corresponding to each discharge gap was simultaneously measured and analysed, aiming to improve quantitative research of non-contact ESD properties.