Gap detecting system design for measurement system of non-contact electrostatic discharge

Lou Shichao, F. Ruan, Su Ming, Wang Tuo, Wang Heng, Xiao Wenjun, Zhi Qijun
{"title":"Gap detecting system design for measurement system of non-contact electrostatic discharge","authors":"Lou Shichao, F. Ruan, Su Ming, Wang Tuo, Wang Heng, Xiao Wenjun, Zhi Qijun","doi":"10.1109/ICASID.2016.7873922","DOIUrl":null,"url":null,"abstract":"Non-contact electrostatic discharge(ESD) taken popularly place in many situations, of military weapon, industrial product, aerospace vehicle, and even in people daily living. Discharge current pulse in non-contact electrostatic discharge with small gap has rise time in nanoseconds, produced wide band disturbance, hence may resulted in serious threat or even damage to microelectronic systems and electronic products. A new electrostatic discharge test system has been designed and made to test electrostatic discharge with different gaps, so as to research their strong influence on discharge result. A design of gap-measuring was proposed for the new ESD test system. Based on the module proposed test data was sent to PLC and and be compared with the position. Discharge current corresponding to each discharge gap was simultaneously measured and analysed, aiming to improve quantitative research of non-contact ESD properties.","PeriodicalId":294777,"journal":{"name":"2016 10th IEEE International Conference on Anti-counterfeiting, Security, and Identification (ASID)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 10th IEEE International Conference on Anti-counterfeiting, Security, and Identification (ASID)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICASID.2016.7873922","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

Non-contact electrostatic discharge(ESD) taken popularly place in many situations, of military weapon, industrial product, aerospace vehicle, and even in people daily living. Discharge current pulse in non-contact electrostatic discharge with small gap has rise time in nanoseconds, produced wide band disturbance, hence may resulted in serious threat or even damage to microelectronic systems and electronic products. A new electrostatic discharge test system has been designed and made to test electrostatic discharge with different gaps, so as to research their strong influence on discharge result. A design of gap-measuring was proposed for the new ESD test system. Based on the module proposed test data was sent to PLC and and be compared with the position. Discharge current corresponding to each discharge gap was simultaneously measured and analysed, aiming to improve quantitative research of non-contact ESD properties.
非接触式静电放电测量系统的间隙检测系统设计
非接触静电放电(ESD)在军事武器、工业产品、航天飞行器乃至人们的日常生活中都得到了广泛的应用。在小间隙非接触静电放电中,放电电流脉冲的上升时间在纳秒级,会产生宽带扰动,对微电子系统和电子产品造成严重威胁甚至破坏。设计并制作了一套新的静电放电测试系统,对不同间隙的静电放电进行测试,研究其对放电结果的强烈影响。提出了一种新型静电放电测试系统的间隙测量设计。基于该模块提出的测试数据被发送到PLC并与位置进行比较。同时测量和分析各放电间隙对应的放电电流,提高非接触ESD特性的定量化研究。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信