Minimization of Timing Failures in Pipelined Designs via Path Shaping and Operand Truncation

Ioannis Tsiokanos, L. Mukhanov, Dimitrios S. Nikolopoulos, G. Karakonstantis
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引用次数: 3

Abstract

The continuous scaling of transistor sizes and the increased static and dynamic parametric variations render nanometer circuits more prone to timing failures. To protect circuits from such failures, typically designers adopt pessimistic timing margins, which are estimated statically under rare worst-case conditions. In this paper, we aim at minimizing the timing failures, while avoiding such pessimistic margins by proposing an approach that initially minimizes the number of long latency paths within each processor pipeline stage and con- straints them in as few stages as possible. Such an approach, not only reduces the timing failures, but also limits the potential error prone locations to only few pipeline registers/stages. To further reduce these failures, we exploit the path excitation dependence on data patterns and we truncate the bit-width of the operands in the few remaining long latency paths by setting a number of least significant bits to a constant value zero. Such truncation may incur quality loss, but this can be controlled by carefully selecting the number of truncated bits and will be in any case less than the catastrophic loss that may be incurred under random timing failures. Additionally, our framework performs post- place and route dynamic timing analysis based on real operands that are extracted from a variety of applications, helping to estimate the dynamic timing failures, while considering the data dependent path excitation. When applied to an IEEE-754 compatible double precision Floating Point Unit (FPU), the proposed approach reduces the timing failures by $104.5\times$ on average compared to a reference FPU design under an assumed 8.1% variation-induced worst-case path delay increase in a 45 nm process. Finally, results show that path shaping alone introduces an insignificant 0.25% area and 5.7% power overhead with no performance cost. The combination of path shaping with aggressive operand bit- width truncation leads to up-to 44.7% on average power savings due to the substantially reduced switching activity at a minimal quality loss.
通过路径整形和操作数截断最小化流水线设计中的时序故障
晶体管尺寸的不断缩放以及静态和动态参数变化的增加使得纳米电路更容易发生时序故障。为了保护电路免受此类故障的影响,设计人员通常采用悲观时间裕度,在罕见的最坏情况下静态估计。在本文中,我们的目标是最小化时序故障,同时通过提出一种方法来避免这种悲观的边际,该方法最初将每个处理器管道阶段中的长延迟路径数量最小化,并将它们约束在尽可能少的阶段中。这种方法不仅减少了计时故障,而且还将潜在的容易出错的位置限制在几个管道寄存器/级。为了进一步减少这些故障,我们利用路径激励对数据模式的依赖,并通过将一些最低有效位设置为常数值零来截断剩余的几个长延迟路径中的操作数的位宽。这种截断可能会导致质量损失,但这可以通过仔细选择截断比特的数量来控制,并且在任何情况下都小于随机时序故障可能导致的灾难性损失。此外,我们的框架基于从各种应用中提取的实际操作数进行后位置和路由动态定时分析,帮助估计动态定时故障,同时考虑数据依赖的路径激励。当应用于兼容IEEE-754的双精度浮点单元(FPU)时,与参考FPU设计相比,在45 nm工艺中假设8.1%的变化引起的最坏情况路径延迟增加下,所提出的方法平均减少了104.5倍。最后,结果表明,仅路径整形就会带来微不足道的0.25%的面积和5.7%的功率开销,而没有性能成本。由于在最小的质量损失下大大减少了开关活动,路径整形与积极的操作数位宽度截断的结合导致平均功耗节省高达44.7%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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