SiGe Technology as a Millimeter-Wave Platform: Scaling Issues, Reliability Physics, Circuit Performance, and New Opportunities

Abstract

This paper reviews recent work aimed at a comprehensive assessment of the potential of SiGe technology to support emerging millimeter-wave (mm-wave) and sub-mm-wave integrated circuit applications. Scaling limits, reliability constraints, and the limits of CMOS for mm-wave are addressed, followed by a diverse variety of mm-wave and sub-mm-wave SiGe circuits that are offered as examples of the many opportunities awaiting.