P. Donohue, J. P. Page, E. Thiele, Y. Hu, M. Saltzberg, S. A. Gallo
{"title":"System 901: low K, copper MCM-C packaging","authors":"P. Donohue, J. P. Page, E. Thiele, Y. Hu, M. Saltzberg, S. A. Gallo","doi":"10.1109/ECTC.1993.346746","DOIUrl":null,"url":null,"abstract":"To meet the packaging needs of today's larger faster IC's DuPont Electronics has developed system 901. It is based on a crystallizable cordierite dielectric for low K, high strength, silicon matched TCE, combined with high conductivity copper metallization. Processing is easily carried out either with copper electrodes in a H/sub 2/O/N/sub 2/ atmosphere or with CuO electrodes in a burnout/reduction/sinter sequence. In both modes, circuits meet packaging performance requirements, especially distortion-free camber, without the need for constrained-sintering. The achievement of these properties has required an understanding of the origin of the forces affecting sintering, and the development of modifiers to control those forces.<<ETX>>","PeriodicalId":281423,"journal":{"name":"Proceedings of IEEE 43rd Electronic Components and Technology Conference (ECTC '93)","volume":"33 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of IEEE 43rd Electronic Components and Technology Conference (ECTC '93)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECTC.1993.346746","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
To meet the packaging needs of today's larger faster IC's DuPont Electronics has developed system 901. It is based on a crystallizable cordierite dielectric for low K, high strength, silicon matched TCE, combined with high conductivity copper metallization. Processing is easily carried out either with copper electrodes in a H/sub 2/O/N/sub 2/ atmosphere or with CuO electrodes in a burnout/reduction/sinter sequence. In both modes, circuits meet packaging performance requirements, especially distortion-free camber, without the need for constrained-sintering. The achievement of these properties has required an understanding of the origin of the forces affecting sintering, and the development of modifiers to control those forces.<>