Determination of Emissivity by Using Reflected Thermal Radiation

F. Liebmann
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Abstract

The determination of emissivity is crucial in any temperature measurement using radiation thermometry. Without this knowledge, large measurement uncertainties result. There is a lack of information on emissivity for common materials. Where there are databases, these databases often give emissivity for a specific material in a range or give emissivity for different conditionings of the material. This information may not apply to certain uses of the material. This creates quite a bit of doubt for anyone making measurements in the field. What is needed is a method to determine emissivity for a material object in the field. In 2011, Yamada and Ishii discussed a method that was set up in a fixed geometry to determine the emissivity of a specular object. In this paper, a method is discussed to determine the emissivity of both specular and diffuse objects using a thermal radiation source. The theory is presented. Then, practical measurements which were made are discussed. These measurements are compared to emissivity determined by other methods.
用反射热辐射法测定发射率
在使用辐射测温法进行任何温度测量时,发射率的测定都是至关重要的。没有这些知识,就会产生很大的测量不确定度。缺乏关于普通材料的发射率的资料。在有数据库的地方,这些数据库通常给出一个范围内特定材料的发射率,或者给出材料不同条件下的发射率。此信息可能不适用于材料的某些用途。这给任何在该领域进行测量的人造成了相当多的怀疑。所需要的是一种方法,以确定发射率的物质对象在该领域。2011年,Yamada和Ishii讨论了一种在固定几何结构中确定镜面物体发射率的方法。本文讨论了一种利用热辐射源确定镜面和漫射物体发射率的方法。提出了理论。然后,对所采取的实际措施进行了讨论。将这些测量结果与用其他方法测定的发射率进行比较。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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