A Comparison of DC and Transient Response Tests for Analogue Circuits

ESSCIRC '92: Eighteenth European Solid-State Circuits conference Pub Date : 1992-09-01 DOI:10.1109/ESSCIRC.1992.5468407

D. Taylor, P. Evans, T. I. Pritchard

引用次数: 4

Abstract

Transient Response Analysis [1] (TRA) is a quick and inexpensive method of testing analogue circuitry. In this paper we compare the effectiveness of traditional DC testing of analogue circuit cells with dynamic tests, using a simple analogue subcircuit element which models one component of a large mixed-signal ASIC.

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模拟电路直流与瞬态响应测试的比较

瞬态响应分析[1](TRA)是一种快速而廉价的测试模拟电路的方法。本文比较了模拟电路单元的传统直流测试和动态测试的有效性，使用一个简单的模拟子电路单元来模拟大型混合信号ASIC的一个组件。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

ESSCIRC '92: Eighteenth European Solid-State Circuits conference

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